# smartctl -a /dev/hdc smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: ST3160023A Serial Number: 4JS03H81 Firmware Version: 8.01 Device is: In smartctl database [for details use: -P show] ATA Version is: 6 ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2 Local Time is: Tue May 9 16:25:10 2006 BST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 430) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 111) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 066 060 006 Pre-fail Always - 141505890 3 Spin_Up_Time 0x0003 096 096 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 1 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 081 060 030 Pre-fail Always - 119664417 9 Power_On_Hours 0x0032 094 094 000 Old_age Always - 5930 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 13 194 Temperature_Celsius 0x0022 038 056 000 Old_age Always - 38 195 Hardware_ECC_Recovered 0x001a 066 060 000 Old_age Always - 141505890 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0 202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 No self-tests have been logged. [To run self-tests, use: smartctl -t] SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. # smartctl -t conveyance /dev/hdc smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION === Warning: device does not support Conveyance Self-Test functions. Sending command: "Execute SMART Conveyance self-test routine immediately in off-line mode". Command "Execute SMART Conveyance self-test routine immediately in off-line mode" failed: Input/output error # smartctl -t short /dev/hdc smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION === Sending command: "Execute SMART Short self-test routine immediately in off-line mode". Drive command "Execute SMART Short self-test routine immediately in off-line mode" successful. Testing has begun. Please wait 1 minutes for test to complete. Test will complete after Tue May 9 16:35:21 2006 Use smartctl -X to abort test. # smartctl -l selftest /dev/hdc smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF READ SMART DATA SECTION === SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Short offline Completed without error 00% 5930 - # 2 Conveyance offline Fatal or unknown error 00% 5930 - # smartctl -t long /dev/hdc smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF OFFLINE IMMEDIATE AND SELF-TEST SECTION === Sending command: "Execute SMART Extended self-test routine immediately in off-line mode". Drive command "Execute SMART Extended self-test routine immediately in off-line mode" successful. Testing has begun. Please wait 111 minutes for test to complete. Test will complete after Tue May 9 18:30:07 2006 Use smartctl -X to abort test. # smartctl -a /dev/hdc smartctl version 5.32 Copyright (C) 2002-4 Bruce Allen Home page is http://smartmontools.sourceforge.net/ === START OF INFORMATION SECTION === Device Model: ST3160023A Serial Number: 4JS03H81 Firmware Version: 8.01 Device is: In smartctl database [for details use: -P show] ATA Version is: 6 ATA Standard is: ATA/ATAPI-6 T13 1410D revision 2 Local Time is: Tue May 9 17:42:00 2006 BST SMART support is: Available - device has SMART capability. SMART support is: Enabled === START OF READ SMART DATA SECTION === SMART overall-health self-assessment test result: PASSED General SMART Values: Offline data collection status: (0x82) Offline data collection activity was completed without error. Auto Offline Data Collection: Enabled. Self-test execution status: ( 0) The previous self-test routine completed without error or no self-test has ever been run. Total time to complete Offline data collection: ( 430) seconds. Offline data collection capabilities: (0x5b) SMART execute Offline immediate. Auto Offline data collection on/off support. Suspend Offline collection upon new command. Offline surface scan supported. Self-test supported. No Conveyance Self-test supported. Selective Self-test supported. SMART capabilities: (0x0003) Saves SMART data before entering power-saving mode. Supports SMART auto save timer. Error logging capability: (0x01) Error logging supported. General Purpose Logging supported. Short self-test routine recommended polling time: ( 1) minutes. Extended self-test routine recommended polling time: ( 111) minutes. SMART Attributes Data Structure revision number: 10 Vendor Specific SMART Attributes with Thresholds: ID# ATTRIBUTE_NAME FLAG VALUE WORST THRESH TYPE UPDATED WHEN_FAILED RAW_VALUE 1 Raw_Read_Error_Rate 0x000f 066 060 006 Pre-fail Always - 232377307 3 Spin_Up_Time 0x0003 096 096 000 Pre-fail Always - 0 4 Start_Stop_Count 0x0032 100 100 020 Old_age Always - 1 5 Reallocated_Sector_Ct 0x0033 100 100 036 Pre-fail Always - 0 7 Seek_Error_Rate 0x000f 081 060 030 Pre-fail Always - 120061148 9 Power_On_Hours 0x0032 094 094 000 Old_age Always - 5931 10 Spin_Retry_Count 0x0013 100 100 097 Pre-fail Always - 0 12 Power_Cycle_Count 0x0032 100 100 020 Old_age Always - 13 194 Temperature_Celsius 0x0022 042 056 000 Old_age Always - 42 195 Hardware_ECC_Recovered 0x001a 066 060 000 Old_age Always - 232377307 197 Current_Pending_Sector 0x0012 100 100 000 Old_age Always - 0 198 Offline_Uncorrectable 0x0010 100 100 000 Old_age Offline - 0 199 UDMA_CRC_Error_Count 0x003e 200 200 000 Old_age Always - 0 200 Multi_Zone_Error_Rate 0x0000 100 253 000 Old_age Offline - 0 202 TA_Increase_Count 0x0032 100 253 000 Old_age Always - 0 SMART Error Log Version: 1 No Errors Logged SMART Self-test log structure revision number 1 Num Test_Description Status Remaining LifeTime(hours) LBA_of_first_error # 1 Extended offline Completed without error 00% 5931 - # 2 Short offline Completed without error 00% 5930 - # 3 Conveyance offline Fatal or unknown error 00% 5930 - SMART Selective self-test log data structure revision number 1 SPAN MIN_LBA MAX_LBA CURRENT_TEST_STATUS 1 0 0 Not_testing 2 0 0 Not_testing 3 0 0 Not_testing 4 0 0 Not_testing 5 0 0 Not_testing Selective self-test flags (0x0): After scanning selected spans, do NOT read-scan remainder of disk. If Selective self-test is pending on power-up, resume after 0 minute delay. # tail -f smartd.log May 9 16:13:28 chandra smartd[4466]: Monitoring 2 ATA and 0 SCSI devices May 9 16:13:29 chandra smartd[4468]: smartd has fork()ed into background mode. New PID=4468. May 9 16:13:29 chandra smartd[4468]: file /var/run/smartd.pid written containing PID 4468 May 9 16:43:31 chandra smartd[4468]: Device: /dev/hdc, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 64 May 9 16:43:31 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 194 Temperature_Celsius changed from 34 to 41 May 9 16:43:31 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 64 May 9 16:43:31 chandra smartd[4468]: Device: /dev/hdc, Self-Test Log error count increased from 0 to 1 May 9 17:13:30 chandra smartd[4468]: Device: /dev/hdc, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 64 to 68 May 9 17:13:30 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 194 Temperature_Celsius changed from 41 to 43 May 9 17:13:30 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 64 to 68 May 9 17:43:29 chandra smartd[4468]: Device: /dev/hdc, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 68 to 67 May 9 17:43:29 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 194 Temperature_Celsius changed from 43 to 42 May 9 17:43:29 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 68 to 67 May 9 18:13:30 chandra smartd[4468]: Device: /dev/hdc, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 67 to 66 May 9 18:13:30 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 194 Temperature_Celsius changed from 42 to 39 May 9 18:13:30 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 67 to 66 May 9 19:13:30 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 38 May 9 20:13:29 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 194 Temperature_Celsius changed from 38 to 39 May 9 20:43:30 chandra smartd[4468]: Device: /dev/hdc, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 65 May 9 20:43:30 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 65 May 9 21:13:29 chandra smartd[4468]: Device: /dev/hda, SMART Usage Attribute: 194 Temperature_Celsius changed from 108 to 106 May 9 21:13:29 chandra smartd[4468]: Device: /dev/hdc, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 65 to 66 May 9 21:13:29 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 65 to 66 May 9 21:43:30 chandra smartd[4468]: Device: /dev/hda, SMART Usage Attribute: 194 Temperature_Celsius changed from 106 to 108 May 9 21:43:30 chandra smartd[4468]: Device: /dev/hdc, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 66 to 65 May 9 21:43:30 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 66 to 65 May 9 23:13:30 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 194 Temperature_Celsius changed from 39 to 38 May 9 23:43:29 chandra smartd[4468]: Device: /dev/hdc, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 65 to 64 May 9 23:43:29 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 65 to 64 May 10 00:13:30 chandra smartd[4468]: Device: /dev/hdc, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 64 to 65 May 10 00:13:30 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 64 to 65 May 10 00:43:29 chandra smartd[4468]: Device: /dev/hdc, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 65 to 64 May 10 00:43:29 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 65 to 64 May 10 01:43:29 chandra smartd[4468]: Device: /dev/hdc, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 64 to 65 May 10 01:43:30 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 64 to 65 May 10 02:13:29 chandra smartd[4468]: Device: /dev/hdc, SMART Prefailure Attribute: 1 Raw_Read_Error_Rate changed from 65 to 66 May 10 02:13:29 chandra smartd[4468]: Device: /dev/hdc, SMART Usage Attribute: 195 Hardware_ECC_Recovered changed from 65 to 66